马甜,李传日,程祺,荣双龙.基于失效物理的微波组件贮存寿命加速试验及预测[J].装备环境工程,2013,10(4):30-33,60. MA Tian,LI Chuan-ri,CHENG Qi,RONG Shuang-long.Microwave Components Accelerated Life Test and Prediction Based on the Failure Physics[J].Equipment Environmental Engineering,2013,10(4):30-33,60.
基于失效物理的微波组件贮存寿命加速试验及预测
Microwave Components Accelerated Life Test and Prediction Based on the Failure Physics
投稿时间:2013-02-16  修订日期:2013-07-01
DOI:10.7643/issn.1672-9242.2013.04.008
中文关键词:  基于失效物理的微波组件贮存寿命加速试验及预测北京航空航天大学可靠性与系统工程学院,北京100083失效物理  中频对数放大器  加速寿命试验  寿命预测
英文关键词:physics of failure  intermediate frequency logarithmic amplifier  accelerated life test  life prediction
基金项目:
作者单位
马甜 基于失效物理的微波组件贮存寿命加速试验及预测北京航空航天大学可靠性与系统工程学院,北京100083 
李传日 基于失效物理的微波组件贮存寿命加速试验及预测北京航空航天大学可靠性与系统工程学院,北京100083 
程祺 基于失效物理的微波组件贮存寿命加速试验及预测北京航空航天大学可靠性与系统工程学院,北京100083 
荣双龙 基于失效物理的微波组件贮存寿命加速试验及预测北京航空航天大学可靠性与系统工程学院,北京100083 
AuthorInstitution
MA Tian Microwave Components Accelerated Life Test and Prediction Based on the Failure PhysicsReliability and System Engineering Institute,Beijing of Aeronautics and Astronautics University,Beijing100191,China 
LI Chuan-ri Microwave Components Accelerated Life Test and Prediction Based on the Failure PhysicsReliability and System Engineering Institute,Beijing of Aeronautics and Astronautics University,Beijing100191,China 
CHENG Qi Microwave Components Accelerated Life Test and Prediction Based on the Failure PhysicsReliability and System Engineering Institute,Beijing of Aeronautics and Astronautics University,Beijing100191,China 
RONG Shuang-long Microwave Components Accelerated Life Test and Prediction Based on the Failure PhysicsReliability and System Engineering Institute,Beijing of Aeronautics and Astronautics University,Beijing100191,China 
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中文摘要:
      随着通信技术的发展和应用,微波器件的应用越来越广泛,尤其在军事装备领域,微波器件随处可见。大多数军事装备,大部分时间处于贮存、检测等非工作状态,为保证其战备完好性,装备的贮存可靠性评估显得尤为重要。中频对数放大系统是雷达接收机组件中的重要组成部分,通过研究微波组件的中频对数放大器部分的相关文献,得到了微波组件主要失效物理模型,确定其失效判据,并由高温加速寿命试验得到的试验数据,计算出组件激活能,最终完成组件在常温贮存下寿命的预测。
英文摘要:
      With the development and application of communication technology, the microwave devices are applied more and more widely, especially in military equipment field. For most of the military equipment, they are in storage, testing and other non-working status most of the time; in order to ensure its proper combat readiness, equipment storage reliability evaluation is particularly important. Intermediate frequency logarithmic amplification system is an important component in radar receiver module. Through researching the relevant literature of intermediate frequency logarithmic amplifier, main failure physics model of microwave components was obtained and failure criterion was determined. The component activation energy was calculated from high temperature accelerated life test data. Components’room temperature storage life was predicted.
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