王九兴,付力力,邢志伟,刘雄飞,王瑞.一种高可靠电子产品贮存寿命评估方法[J].装备环境工程,2019,16(3):26-29. WANG Jiu-xing,FU Li-li,XING Zhi-wei,LIU Xiong-fei,WANG Rui.A Storage Life Assessment Method of Highly Reliable Electronic Product[J].Equipment Environmental Engineering,2019,16(3):26-29.
一种高可靠电子产品贮存寿命评估方法
A Storage Life Assessment Method of Highly Reliable Electronic Product
投稿时间:2018-10-07  修订日期:2019-03-25
DOI:10.7643/ issn.1672-9242.2019.03.006
中文关键词:  多应力  加速试验  贮存寿命评估
英文关键词:multi-stress  accelerated test  storage life assessment
基金项目:
作者单位
王九兴 1.北京控制与电子技术研究所,北京 100038 
付力力 1.北京控制与电子技术研究所,北京 100038 
邢志伟 1.北京控制与电子技术研究所,北京 100038 
刘雄飞 2.中国航天科工运载技术研究院 北京分院,北京 102308 
王瑞 2.中国航天科工运载技术研究院 北京分院,北京 102308 
AuthorInstitution
WANG Jiu-xing 1. Beijing Institute of Control and Electronics Technology, Beijing 100038, China 
FU Li-li 1. Beijing Institute of Control and Electronics Technology, Beijing 100038, China 
XING Zhi-wei 1. Beijing Institute of Control and Electronics Technology, Beijing 100038, China 
LIU Xiong-fei 2. Launch Vehicle Technology Academy of China Aerospace Science & Technology Industry Corporation, Beijing 102308, China 
WANG Rui 2. Launch Vehicle Technology Academy of China Aerospace Science & Technology Industry Corporation, Beijing 102308, China 
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中文摘要:
      介绍了加速寿命试验的基本理论,并给出一种基于多应力加速试验的高可靠电子产品贮存寿命评估方法。首先给出一种基于多应力加速试验的电子产品贮存寿命评估流程,然后指出关键环节是根据产品特点选择合适的加速应力、加速模型,最后给出数据处理方法。该评估方法经过了工程实践,快速评估出一种高可靠产品的贮存寿命。
英文摘要:
      This paper proposed a method of the storage life assessment for high reliability electronic product based on the accelerated test with multiple accelerating stresses. First, the technological process of the storage life assessment for electronic products based on the accelerated test with multiple accelerating stresses was introduced; then it was pointed that the key was to choose accelerating stresses and accelerated model according to characteristics of product. This assessment method is verified through practice. It could rapidly assess the storage life of highly reliable product.
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