| 姜普涛,韩建立,马俊慧,吴一乔.弹用电连接器湿热环境下寿命预测[J].装备环境工程,2022,19(8):13-20. JIANG Pu-tao,HAN Jian-li,MA Jun-hui,WU Yi-qiao.Lifetime Prediction of Missile Electrical Connector under Hot and Humid Environment[J].Equipment Environmental Engineering,2022,19(8):13-20. |
| 弹用电连接器湿热环境下寿命预测 |
| Lifetime Prediction of Missile Electrical Connector under Hot and Humid Environment |
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| DOI：10.7643/issn.1672-9242.2022.08.003 |
| 中文关键词: 电连接器 寿命预测 导弹服役环境 Wiener过程 Eyring模型 加速退化试验中图分类号:TJ760 文献标识码:A 文章编号:1672-9242(2022)08-0013-08 |
| 英文关键词:electrical connector lifetime prediction missile service environment Wiener process Eyring model accelerated degradation test |
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| Author | Institution |
| JIANG Pu-tao | Naval Aviation University, Shandong Yantai 264000, China;Unit 91423 of the PLA, Liaoning Dalian 116041, China |
| HAN Jian-li | Naval Aviation University, Shandong Yantai 264000, China |
| MA Jun-hui | Unit 92808 of the PLA, Hainan Sansha 573199, China |
| WU Yi-qiao | Naval Aviation University, Shandong Yantai 264000, China |
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| 摘要点击次数: |
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| 中文摘要: |
| 目的 预测某型电连接器的剩余寿命。方法 以某弹用电连接器为研究对象，在分析导弹服役环境和电连接器失效机理的基础上，基于电连接器接触电阻性能退化特点，利用Wiener过程拟合电连接性能退化轨迹。然后，以Wiener过程的漂移参数为中间变量，采用广义Eyring模型，对温度、湿度应力进行建模，进而根据试验数据对性能退化数据似然函数的参数进行估计。最后，结合加速模型，推导得到正常应力水平下的漂移参数值，从而确定出电连接器的可靠度模型。结果 计算出样品电连接器的平均寿命，可进一步推断该型电连接器的其他寿命信息。结论 Wiener过程可以拟合湿热环境下电连接器的性能退化轨迹，温湿应力是开展弹上设备试验需重点关注的因素，考虑进一步提高类似环境载荷下的加速退化试验效率，可在一定程度上增大温度应力水平。 |
| 英文摘要: |
| This paper is to predict the remaining lifetime of a certain type of electrical connector. Taking a certain missile electrical connector as the research object, on the basis of analyzing missile service environment and failure mechanism of electrical connectors, and based on the degradation characteristics of electrical connector contact resistance performance, the Wiener process is used to fit the degradation track of the electrical connection performance. And then, with the drift parameters of the Wiener process as the intermediate variables, the generalized Eyring model is used to model the temperature and humidity stress. Then the parameters of likelihood function of performance degradation data are estimated according to the test data. Finally, combined with the acceleration model, the drift parameters under the normal stress level are derived, and the reliability model of the electrical connector is determined. The average lifetime of the sample electrical connector is calculated, which can further infer other lifetime information of this type of electrical connector. Wiener process can fit the performance degradation tracks of the electrical connector under hot and humid environment. The temperature and humidity stress are the key factors to be paid attention to when carrying out test of equipment on missile. Considering further improving the efficiency of accelerated degradation test under similar environmental loads, the temperature stress level can be increased to a certain extent. |
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