| 苏兴荣,尹聚文.GaAs MMIC功率放大器加速寿命试验及可靠性评估[J].装备环境工程,2014,11(1):24-29. SU Xing-rong,YIN Ju-wen.Accelerated Life Test and Reliability Evaluation of GaAs MMIC Power Amplifier[J].Equipment Environmental Engineering,2014,11(1):24-29. |
| GaAs MMIC功率放大器加速寿命试验及可靠性评估 |
| Accelerated Life Test and Reliability Evaluation of GaAs MMIC Power Amplifier |
| 投稿时间：2013-09-03 修订日期：2013-10-09 |
| DOI：10.7643/issn.1672-9242.2014.01.005 |
| 中文关键词: 加速寿命试验 GaAs MMIC 功率放大器 失效率 可靠性评估 |
| 英文关键词:accelerated life test GaAs MMIC power amplifier failure rate reliability assessment |
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| 中文摘要: |
| 目的评估新研GaAs微波单片集成电路（MMIC）功率放大器的可靠性指标。方法用图估法和范-蒙特福特检验法对失效数据进行分布假设检验，利用贝叶斯定理估算低温度应力下无失效数据的威布尔分布参数。结果在正常工作情况下，结温为150℃时，该器件特征寿命为833370h，10年平均失效率为1.2472×10-7/h，平均寿命为738540h，可靠度等于0.9时的可靠寿命为31年。结论该型器件在结温小于250℃时服从威布尔分布，结温为270℃时器件的失效机理已发生了变化，器件的各项可靠性指标满足使用要求。 |
| 英文摘要: |
| ObjectiveConstant temperature stress accelerated life test was used to evaluate the reliability index of GaAs microwave monolithic integrated circuit（MMIC）power amplifier.MethodsThe failure time distribution of the device was detected by using the probability paper and Van-Montfort methods，and Bayes principle was used to estimate Weibull distribution parameters at the lowest temperature level without failure data.ResultsA series of calculating results were achieved under normal working condition（θj=150℃）: the characteristic life was 833370h，the mean failure rate for 10years was1.2472×10-7h，the mean life was 738540h and the reliable life was31years with a reliability of0.9. ConclusionThe reliability index of this device was well enough to meet our needs，and the lifetime of the device obeyed Weibull Distribution below250℃，but the failure mechanism changed when the junction temperature was above270℃. |
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