电子仪器整机工作寿命加速试验方法研究及应用

薛良良; 胡雨晴; 宋月

doi:10.7643/issn.1672-9242.2026.06.007

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装备环境工程 ›› 2026, Vol. 23 ›› Issue (6) : 80-91. DOI: 10.7643/issn.1672-9242.2026.06.007

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电子仪器整机工作寿命加速试验方法研究及应用

薛良良, 胡雨晴, 宋月

作者信息 +

Methods and Application of Accelerated Testing Schemes for the Operational Life of Complete Electronic Instruments

XUE Liangliang, HU Yuqing, SONG Yue

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文章历史 +

摘要

目的针对电子仪器工作寿命指标高、样本量小、性能鉴定阶段试验时间长难题,提出一种结合产品底层信息、基于系统可靠性模型和Flotherm仿真的整机工作寿命加速试验方案。方法通过工作环境敏感应力、整机薄弱环节和失效机理分析,定位出整机关键功能电路,结合系统可靠性串并联模型和器件级激活能信息,考虑长时加电导致的温升效应,利用温度仿真数据,改进阿伦尼斯模型,通过理论推导给出针对温度敏感应力下的整机加速因子。结果以某型配电器长时加电为例,给出了演算过程,得到了整机加速试验剖面。最后在基于温度敏感应力加速的基础上,考虑湿度、电场环境应力及失效机理,同步给出了在温度、湿度和温度、电场双应力下的整机加速方法设计思路。结论该方案为小样本整机产品长时加电工作通用加速试验方案设计提供参考。

Abstract

To address the challenges of high operational life targets, small sample sizes, and lengthy testing periods during the performance qualification phase of electronic instrument products, the work aims to propose an accelerated life testing scheme combining underlying product information, system reliability model and Flotherm simulation for the complete instrument. Through the analysis of operational environment sensitive stresses, weak links of the complete instrument and failure mechanisms, the key functional circuits of the complete instrument were identified. By integrating a system reliability series-parallel model with component-level activation energy information, and considering the temperature rise effect caused by prolonged power-on, the Arrhenius model was modified with the temperature simulation data. The acceleration factor for the complete instrument under temperature sensitive stress was derived theoretically. With a certain type of power distributor under long-term power-on as an example, the calculation process was obtained, resulting in an accelerated testing profile for the complete instrument. Finally, based on temperature sensitive stress acceleration, and in consideration of humidity, electric field environmental stresses, and their failure mechanisms, design methodologies for accelerated testing under combined temperature-humidity and temperature-electric field dual stresses were synchronously proposed. This work provides a reference for a general accelerated testing scheme for complete on-board instrument products with small sample sizes under long-term power-on conditions.

导出引用

薛良良, 胡雨晴, 宋月. 电子仪器整机工作寿命加速试验方法研究及应用[J]. 装备环境工程. 2026, 23(6): 80-91 https://doi.org/10.7643/issn.1672-9242.2026.06.007

XUE Liangliang, HU Yuqing, SONG Yue. Methods and Application of Accelerated Testing Schemes for the Operational Life of Complete Electronic Instruments[J]. Equipment Environmental Engineering. 2026, 23(6): 80-91 https://doi.org/10.7643/issn.1672-9242.2026.06.007

中图分类号： TB114.3

参考文献

[1] 张仕念, 颜诗源, 徐军, 等. 导弹弹上仪器工作寿命考核方法探讨[J]. 电子产品可靠性与环境试验, 2017, 35(2): 1-4.
ZHANG S N, YAN S Y, XU J, et al.Discussion on the Working Life Assessment Method of Missile-Borne Instrument[J]. Electronic Product Reliability and Environmental Testing, 2017, 35(2): 1-4.
[2] 熊剑, 周宇, 眭海军, 等. 仪控电源模件关键元器件退化行为研究[J]. 集成电路应用, 2024, 41(2): 11-15.
XIONG J, ZHOU Y, SUI H J, et al.Study on the Degradation Behavior of Key Components of Instrument Control Power Module[J]. Application of IC, 2024, 41(2): 11-15.
[3] 赵臣龙. 电子元器件可靠性测试与评估分析[J]. 集成电路应用, 2024, 41(6): 50-51.
ZHAO C L.Analysis of Reliability Testing and Evaluation of Electronic Devices[J]. Application of IC, 2024, 41(6): 50-51.
[4] YANG D J, MA J W, ZHANG Q, et al.Accelerated Test of Silicone Rubbers Exposing to PEMFC Environment[J]. Progress in Natural Science: Materials International, 2020, 30(6): 882-889.
[5] 王洋, 林振衡, 郑志杰, 等. 基于THz-TDS的氟橡胶材料寿命预测方法[J]. 光谱学与光谱分析, 2024, 44(6): 1578-1583.
WANG Y, LIN Z H, ZHENG Z J, et al.Lifetime Prediction Method for Fluororubber Based on Terahertz Time Domain Spectrum Technology[J]. Spectroscopy and Spectral Analysis, 2024, 44(6): 1578-1583.
[6] 张生鹏, 唐宇彬, 张安琪, 等. 导弹整机贮存寿命加速试验建模与评估技术[J]. 航天器环境工程, 2024, 41(6): 742-750.
ZHANG S P, TANG Y B, ZHANG A Q, et al.Modeling and Evaluation for Accelerated Storage Life Test of Assembly Missile Equipment[J]. Spacecraft Environment Engineering, 2024, 41(6): 742-750.
[7] 段飞飞, 苏振李, 王田宇, 等. 整机加速贮存试验与寿命快速评价方案设计[J]. 中国工程机械学报, 2024, 22(4): 556-560.
DUAN F F, SU Z L, WANG T Y, et al.Design of Accelerated Storage Test and Rapid Life Evaluation Scheme for Whole Machine[J]. Chinese Journal of Construction Machinery, 2024, 22(4): 556-560.
[8] 梁晨宇, 周小燕, 孔繁林, 等. 激光焦平面探测器组件工作寿命评估方法[J]. 半导体技术, 2025, 50(8): 869-872.
LIANG C Y, ZHOU X Y, KONG F L, et al.Method for Evaluating the Operating Life of Laser Focal Plane Detector Components[J]. Semiconductor Technology, 2025, 50(8): 869-872.
[9] MAOULIDA F, GUILBERT D, CAMARA M B, et al.Dynamic Electrical Degradation of PEM Electrolyzers under Renewable Energy Intermittency: Mechanisms, Diagnostics, and Mitigation Strategies - a Comprehensive Review[J]. Renewable and Sustainable Energy Reviews, 2026, 225: 116170.
[10] IYYAPPAN C, REDDY C C.Inverse Power Law Based Inclusive Life Model for DC Polarity Reversal Stresses[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2021, 28(2): 586-593.
[11] 周小燕, 何伟, 梁晨宇, 等. 硅雪崩光电探测器加速工作寿命试验应用研究[J]. 科学技术与工程, 2016, 16(16): 199-201.
ZHOU X Y, HE W, LIANG C Y, et al.The Application Research of Accelerated Working Life Test for Silicon Avalanceh Photoelecrric Detector[J]. Science Technology and Engineering, 2016, 16(16): 199-201.
[12] 周前, 汤华龙, 杨存哲, 等. 电源模块工作寿命提高方法的研究[J]. 上海电气技术, 2014, 7(3): 14-17.
ZHOU Q, TANG H L, YANG C Z, et al.Study on the Measures to Improve the Working Life of Power Supply Module[J]. Journal of Shanghai Electric Technology, 2014, 7(3): 14-17.
[13] 韩兆芳. 接口混合集成电路长期工作寿命预计及验证[J]. 电子质量, 2023(3): 44-47.
HAN Z F.Prediction and Verification of Long Work Life of Hybrid Integrated Circuit[J]. Electronics Quality, 2023(3): 44-47.
[14] 蔡健平, 向刚, 徐洪武, 等. 电子产品长期加电工作条件下的加速寿命试验技术研究[J]. 质量与可靠性, 2024(3): 19-22.
CAI J P, XIANG G, XU H W, et al.Research on Test Verification Technology for Life of Electric Products of Long-Term Power-on[J]. Quality and Reliability, 2024(3): 19-22.
[15] 刘愉. 压力变送器加速工作寿命试验[J]. 自动化与仪器仪表, 2012(3): 193.
LIU Y.Pressure Transmitter Acceleration Life Test[J]. Automation & Instrumentation, 2012(3): 193.
[16] 杨盼奎, 王大奎, 江斌, 等. 电子延时开关复合温度及电应力加速模型研究[J]. 设备管理与维修, 2021(7): 126-129.
YANG P K, WANG D K, JIANG B, et al.Study on Compound Temperature and Electrical Stress Acceleration Model of Electronic Delay Switch[J]. Plant Maintenance Engineering, 2021(7): 126-129.
[17] 马月红. 基于电应力加速试验数据的可靠性评估[J]. 仪表技术与传感器, 2014(6): 141-143.
MA Y H.Reliability Evaluation Based on Accelerated Test Data under Electrical Stress[J]. Instrument Technique and Sensor, 2014(6): 141-143.
[18] 冯睿. 功率MOSFET多应力加速试验设计及退化建模研究[D]. 哈尔滨: 哈尔滨工业大学, 2021.
FENG R.Research on Design of Multi-stress Accelerated Testing and Degradation Modeling of Power MOSFET[D]. Harbin: Harbin Institute of Technology, 2021.
[19] 孙志旺, 梁玉英, 潘刚, 等. 电应力加速退化试验技术及可靠性评估研究[J]. 中国测试, 2014, 40(5): 140-144.
SUN Z W, LIANG Y Y, PAN G, et al.Research on Electrical-Stress Accelerated Degradation Test Technique and Reliability Assessment Method[J]. China Measurement & Test, 2014, 40(5): 140-144.
[20] 王尧. LED照明灯具电—热应力加速寿命测试方法的研究[D]. 长春: 中国科学院长春光学精密机械与物理研究所, 2017.
WANG Y.Research on Accelerated Aging Tests under Electric and Thermal Stresses for LED Lamps[D]. Changchu: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2017.
[21] GONG M F, SUN X J, LEI C, et al.Study on the Degradation Performance of AlGaN-Based Deep Ultraviolet LEDs under Thermal and Electrical Stress[J]. Coatings, 2024, 14(7): 904.
[22] 李凌, 林瑞仕, 朱旭锋, 等. 元器件性能退化机理及寿命预测方法研究[J]. 电子质量, 2023(11): 98-104.
LI L, LIN R S, ZHU X F, et al.Study on the Degradation Mechanisms and Life Prediction Methods of Components[J]. Electronics Quality, 2023(11): 98-104.
[23] 张春成, 袁瑞明, 吕强, 等. 不同散热器结构对其散热特性影响的数值研究[J]. 环境技术, 2024, 42(6): 152-156.
ZHANG C C, YUAN R M, (LÜ/LV/LU/LYU) Q, et al. Numerical Investigation of the Effect of Different Radiator Structures on Heat Dissipation Characteristics[J]. Environmental Technology, 2024, 42(6): 152-156.
[24] 刘加豪, 古莉娜, 陈方舟, 等. 一种基于热阻矩阵的2.5D封装芯片结温预测模型[J]. 电子产品可靠性与环境试验, 2024(1): 63-67.
LIU J H, GU L N, CHEN F Z, et al.A Junction Temperature Prediction Model for 2.5D Packaging Chip Based on Thermal Resistance Matrix[J]. Electronic Product Reliability and Environmental Testing, 2024(1): 63-67.
[25] 童钦, 刘松, 梁君. 基于flotherm的一种航电设备的可靠性热仿真分析[J]. 机械研究与应用, 2025, 38(6): 9-11.
TONG Q, LIU S, LIANG J.Reliability Thermal Simulation Analysis of an Electronic Equipment Based on Flotherm[J]. Mechanical Research & Application, 2025, 38(6): 9-11.
[26] 卢炽华, 张艳杰, 卢思思, 等. 基于Hallberg-Peck模型的玻璃纤维增强PC的性能与寿命[J]. 塑料工业, 2022, 50(7): 106-109.
LU C H, ZHANG Y J, LU S S, et al.Properties and Lifetime of Glass Fiber Reinforced Polycarbonate Based on Hallberg-Peck Model[J]. China Plastics Industry, 2022, 50(7): 106-109.
[27] 岳峰. 基于Hallberg-Peck模型的继电保护装置寿命评估及加速试验[J]. 电工技术, 2022(13): 107-109.
YUE F.Life Evaluation and Acceleration Test of Relay Protection Device Based on Hallberg-Peck Model[J]. Electric Engineering, 2022(13): 107-109.
[28] 王伟健, 陈燕飞, 李书鹏, 等. 基于Hallberg-Peck模型的汽车发动机罩盖三元乙丙橡胶缓冲垫块加速老化试验条件研究[J]. 橡胶工业, 2021, 68(6): 459-463.
WANG W J, CHEN Y F, LI S P, et al.Study on Accelerated Aging Test Conditions of EPDM Cushion Blocks of Automobile Engine Cover Based on Hallberg-Peck Model[J]. China Rubber Industry, 2021, 68(6): 459-463.