目的 为应对导弹武器20 a以上的超长贮存期、贮存试验样本量不足以及研制鉴定周期紧迫等严峻挑战,提出一种机电产品整机加速因子获取方法,解决加速试验方案设计与寿命评估中的核心难题。方法 系统梳理加速贮存试验的一般流程,深入剖析其在整机应用中的瓶颈。定性对比失效率比值法、加速退化法及转化法等方法的适用性,分析其在样本稀疏条件下的固有缺陷。在此基础上,研究并提出一种基于可靠寿命等效原则,在样本稀疏条件下利用元器件和原材料数据获取整机加速因子的工程方法,将威布尔分布与指数分布进行融合,利用可靠度作为桥梁,获取整机加速因子。结果 以导弹武器中某复杂机电产品为例,详细列举了使用的电子元器件和原材料类型,假设贮存期末可靠性指标为0.95,贮存温度为21 ℃,加速温度为75 ℃,计算得到该机电产品整机加速因子为36.855。结论 研究结果表明,整机加速因子近似等效于激活能0.59 eV,验证了该方法能够真实地反映整机机电产品的复杂失效特性,可为导弹武器复杂机电产品整机加速贮存试验的方案设计与结果外推提供精确的参数输入与技术途径,同时对具有长期贮存要求的复杂机电产品具有重要的理论参考价值。
Abstract
The work aims to propose a novel method for determining overall system acceleration factors to resolve core issues in accelerated test design and life assessment to address the arduous challenges posed by extremely long-term storage (exceeding 20 years), insufficient sample sizes, and urgent development cycles for missile weapon electromechanical systems. First, the general process of accelerated storage testing was systematically reviewed, with in-depth analysis of its limitations in full-system applications. Second, existing methods, including the failure rate ratio method, the accelerated degradation method, and the transformation method, were qualitatively compared and analyzed to highlight their applicability and inherent deficiencies in quantification under sparse data conditions. On this basis, this paper investigated and proposed an engineering method for obtaining the whole-system acceleration factor under sparse sample conditions using component and raw material data, based on the principle of reliable life equivalence. This method integrated the Weibull distribution and the exponential distribution, with reliability as a bridge to derive the whole-system acceleration factor. A case study of a complex electromechanical product in missile systems was presented, detailing the types of electronic components and raw materials used. Assuming a storage period reliability of 0.95, ambient storage temperature of 21 ℃, and accelerated test temperature of 75 ℃, the calculated overall system acceleration factor was 36.855. Results demonstrate that this acceleration factor approximates an activation energy of 0.59 eV, validating the method's ability to accurately capture the complex failure characteristics of full-system components. This approach provides precise parameter inputs and technical pathways for designing accelerated storage tests and extrapolating results for missile weapon electromechanical systems, offering significant theoretical value and engineering application potential for other complex equipment requiring long-term storage.
关键词
导弹武器 /
机电产品 /
加速贮存试验 /
激活能 /
加速因子 /
失效率
Key words
missile weapons /
electromechanical product /
accelerated storage testing /
activation energy /
acceleration factor /
failure rate
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参考文献
[1] 王浩伟, 滕克难, 吕卫民. 导弹贮存延寿试验关键技术及研究进展[J]. 含能材料, 2019, 27(12): 1004-1016.
WANG H W, TENG K N, LYU W M.Review on Key Technologies for Missile Storage and Life-Extension Test[J]. Chinese Journal of Energetic Materials, 2019, 27(12): 1004-1016.
[2] 孙立敏. 防空导弹贮存可靠性设计分析评估[M]. 北京: 中国宇航出版社, 2023.
SUN L M.Analysis and Evaluation of Storage Reliability Design of Air Defense Missile[M]. Beijing: China Astronautics Publishing House, 2023.
[3] 张生鹏, 李宏民, 赵朋飞. 导弹装备贮存寿命加速试验技术体系探讨[J]. 装备环境工程, 2018, 15(2): 92-96.
ZHANG S P, LI H M, ZHAO P F.Accelerated Testing Technology System for Storage Life of Missile Equipment[J]. Equipment Environmental Engineering, 2018, 15(2): 92-96.
[4] 林震, 姜同敏, 程永生, 等. 阿伦尼斯模型研究[J]. 电子产品可靠性与环境试验, 2005, 23(6): 12-14.
LIN Z, JIANG T M, CHENG Y S, et al.Study on Arrhenius Relationship[J]. Electronic Product Reliability and Environmental Testing, 2005, 23(6): 12-14.
[5] 刘晓娣, 韩建立, 姜普涛. 弹上电子部件加速因子估计方法研究[J]. 装备环境工程, 2022, 19(8): 7-12.
LIU X D, HAN J L, JIANG P T.Acceleration Factor Estimation of Missile-Borne Electronic Components[J]. Equipment Environmental Engineering, 2022, 19(8): 7-12.
[6] 吴松, 吕晶晶, 李小康. 可靠性加速寿命试验综述[J]. 电子产品可靠性与环境试验, 2021, 39(1): 94-100.
WU S, LYU J J, LI X K.Review of Reliability Accelerated Life Test[J]. Electronic Product Reliability and Environmental Testing, 2021, 39(1): 94-100.
[7] 钱萍, 陈文华, 马子魁, 等. 综合应力加速寿命模型验证方法的研究[J]. 机械工程学报, 2010, 46(24): 156-161.
QIAN P, CHEN W H, MA Z K, et al.Research of Multiple Stresses Accelerated Life Model Verification Method[J]. Journal of Mechanical Engineering, 2010, 46(24): 156-161.
[8] 姜普涛, 韩建立, 马俊慧, 等. 弹用电连接器湿热环境下寿命预测[J]. 装备环境工程, 2022, 19(8): 13-20.
JIANG P T, HAN J L, MA J H, et al.Lifetime Prediction of Missile Electrical Connector under Hot and Humid Environment[J]. Equipment Environmental Engineering, 2022, 19(8): 13-20.
[9] 赵帅帅, 陈永祥, 贾业宁, 等. 基于修正Coffin-Manson模型的加速寿命试验设计与评估[J]. 强度与环境, 2013, 40(4): 52-58.
ZHAO S S, CHEN Y X, JIA Y N, et al.Design and Assessment of Accelerated Life Testing Based on Modified Coffin-Manson Model[J]. Structure & Environment Engineering, 2013, 40(4): 52-58.
[10] 曾文彬, 宋梁, 张西应, 等. 基于Coffin-Manson模型功率半导体器件可靠性评估[J]. 电力电子技术, 2022, 56(7): 138-140.
ZENG W B, SONG L, ZHANG X Y, et al.Reliability Evaluation for Power Semiconductor Device Using Coffin-Manson Model[J]. Power Electronics, 2022, 56(7): 138-140.
[11] 吕瑛, 王爱清, 闫凯, 等. 微波功率放大组件加速贮存数据处理及寿命评估[J]. 装备环境工程, 2023, 20(10): 108-117.
LYU Y, WANG A Q, YAN K, et al.Accelerated Storage Data Processing and Life Assessment of Microwave Power Amplification Modules[J]. Equipment Environmental Engineering, 2023, 20(10): 108-117.
[12] 周勇. 高分子材料的老化研究[J]. 国外塑料, 2012, 30(1): 35-41.
ZHOU Y.Aging Studies of Macromolecule[J]. World Plastics, 2012, 30(1): 35-41.
[13] 陈循, 张春华, 汪亚顺, 等. 加速寿命试验技术与应用[M]. 北京: 国防工业出版社, 2013.
CHEN X, ZHANG C H, WANG Y S, et al.Accelerated Life Testing Technology and Application[M]. Beijing: National Defense Industry Press, 2013.
[14] 李敏伟, 傅耘, 王丽, 等. 加速贮存寿命试验设计方法研究[J]. 装备环境工程, 2014, 11(4): 58-64.
LI M W, FU Y, WANG L, et al.Study of the Design Method of the Accelerated Storage Life Testing[J]. Equipment Environmental Engineering, 2014, 11(4): 58-64.
[15] 张文广, 贺东旭, 李浩瀚, 等. 机电产品加速贮存试验与寿命评估方法研究[J]. 机电工程, 2021, 38(5): 528-535.
ZHANG W G, HE D X, LI H H, et al.Accelerated Storage Test and Life Evaluation Method of Electromechanical Products[J]. Journal of Mechanical & Electrical Engineering, 2021, 38(5): 528-535.
[16] 姚军, 韩娜, 傅玲莉. 加速贮存寿命试验及可靠性评估[J]. 装备环境工程, 2019, 16(3): 71-75.
YAO J, HAN N, FU L L.Accelerate Storage Life Test and Reliability Evaluation[J]. Equipment Environmental Engineering, 2019, 16(3): 71-75.
[17] 陈中青, 朱宜生, 王超, 等. 电子设备可靠性加速试验方法的研究与应用[J]. 环境技术, 2021, 39(1): 64-68.
CHEN Z Q, ZHU Y S, WANG C, et al.Research and Application of Reliability Acceleration Test for Electronic Equipment[J]. Environmental Technology, 2021, 39(1): 64-68.
[18] 谢丽梅, 时钟, 黄创棉, 等. 某航天产品加速试验技术研究[J]. 可靠性与环境试验技术及评价. 2019, 37(S1): 1-7.
XIE L M, SHI Z, HUANG C M, et al.Research on Accelerated Test Technology for anAerospace Product[J]. Electronic Product Reliability and Environmental Testing, 2019, 37(S1): 1-7.
[19] 董军超, 韩铭, 陈津虎. 基于应力分解法的整机加速因子预计方法研究[J]. 装备环境工程, 2021, 18(9): 14-19.
DONG J C, HAN M, CHEN J H.Research on Prediction Method of Acceleration Factor of Complete Machine Based on Stress Decomposition Method[J]. Equipment Environmental Engineering, 2021, 18(9): 14-19.
[20] 中国人民解放军总装备部. 电子设备非工作状态可靠性预计手册: GJB/Z 108A—2006[S]. 北京: 总装备部军标出版发行部, 2007.
General Armaments Department of the People's Liberation Army. Electronic Equipment Non-Operating Reliability Prediction Manual: GJB/Z 108A—2006[S]. Beijing: Military Standard Publishing and Distribution Department of the General Armament Department, 2007.
[21] 董澍, 张亮, 刘春雷, 等. 星上单机级电子产品加速寿命试验方法研究[J]. 质量与可靠性, 2013(5): 6-9.
DONG S, ZHANG L, LIU C L, et al.Research on Accelerated Life Test Method of Single-Stage Electronic Products on Board[J]. Quality and Reliability, 2013(5): 6-9.
[22] 徐如远, 袁宏杰, 李鹏, 等. 基于薄弱环节的整机加速因子计算[J]. 装备环境工程, 2019, 16(3): 1-4.
XU R Y, YUAN H J, LI P, et al.Whole Machine Acceleration Factor Based on Weak Links[J]. Equipment Environmental Engineering, 2019, 16(3): 1-4.
[23] 李海波, 张正平, 胡彦平. 加速寿命试验方法及其在航天产品中的应用[J]. 强度与环境, 2007, 34(1): 2-10.
LI H B, ZHANG Z P, HU Y P.Accelerated Life Testing Method and Its Applications for Space Products[J]. Structure & Environment Engineering, 2007, 34(1): 2-10.
[24] 代永德, 栾家辉, 韩慧超, 等. 某型电子产品贮存寿命加速退化试验方法研究[J]. 机电技术, 2021(6): 12-14.
DAI Y D, LUAN J H, HAN H C, et al.Study on Accelerated Degradation Test Method of Storage Life of an Electronic Product[J]. Mechanical & Electrical Technology, 2021(6): 12-14.
[25] 国家国防科技工业局. 电子产品老炼试验方法: QJ 908B—2012[S]. 北京: 中国航天标准化研究所, 2013.
State Administration of Science. Technology and Industry for National Defense. Aging Test Method for Electronic Products: QJ 908B—2012[S]. Beijing: CASC, 2013.
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