湿热环境下电子引信缺陷演化对引信贮存寿命的影响分析
张成, 张骢, 喻俊淼, 史瑞, 李海铭
Analysis of the Impact of Defect Evolution on the Storage Life of Electronic Fuzes under Hot-Humid Environments
ZHANG Cheng, ZHANG Cong, YU Junmiao, SHI Rui, LI Haiming
装备环境工程
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2025, (10): 11
-17
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DOI: 10.7643/ issn.1672-9242.2025.10.002
