唐宇彬,张生鹏,徐如远,李昊,倪瑞政.电子整机加速贮存试验结果验证方法研究[J].装备环境工程,2025,22(5):34-41. TANG Yubin,ZHANG Shengpeng,XU Ruyuan,LI Hao,NI Ruizheng.Verification Method of Accelerated Storage Test Results for Electronic Equipment[J].Equipment Environmental Engineering,2025,22(5):34-41. |
电子整机加速贮存试验结果验证方法研究 |
Verification Method of Accelerated Storage Test Results for Electronic Equipment |
投稿时间:2025-03-28 修订日期:2025-05-04 |
DOI:10.7643/issn.1672-9242.2025.05.006 |
中文关键词: 电子产品 加速贮存试验 相关性分析 灰关联熵 距离系数 寿命评估中图分类号:TJ089 文献标志码:A 文章编号:1672-9242(2025)05-0034-06 |
英文关键词:electronic equipment accelerated storage life test correlation analysis gray relational entropy distance coefficient life evaluation |
基金项目:技术基础科研项目(JSHS2022208B001) |
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Author | Institution |
TANG Yubin | Aerospace Science and Industry Defense Technology Research and Test Center, Beijing 100854, China |
ZHANG Shengpeng | Aerospace Science and Industry Defense Technology Research and Test Center, Beijing 100854, China |
XU Ruyuan | Aerospace Science and Industry Defense Technology Research and Test Center, Beijing 100854, China |
LI Hao | Aerospace Science and Industry Defense Technology Research and Test Center, Beijing 100854, China |
NI Ruizheng | Aerospace Science and Industry Defense Technology Research and Test Center, Beijing 100854, China |
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中文摘要: |
目的 确定加速贮存试验中电子整机的加速因子,并评估整机加速贮存试验结果的准确性。方法 基于零部组件产品的贮存寿命信息,建立整机贮存寿命模型,综合计算整机加速因子。采用灰关联熵分析、距离系数分析方法,对自然贮存与加速贮存数据的相关性进行分析和评价,验证可加速性。最后通过对比自然及加速贮存试验数据外推寿命结果,验证整机加速贮存试验结果的准确性。结果 结合某微波电子整机的自然贮存试验和加速贮存试验数据,加速贮存试验结果相对自然贮存试验误差小于5%,加速因子及寿命评估结果准确。结论 该方法可为电子整机加速开展加速贮存试验及寿命评估提供一种新的技术途径。 |
英文摘要: |
The work aims to determine the acceleration factor of the electronic equipment and evaluate the accuracy of the accelerated storage life test results. Based on the storage life information of component products, a storage life model was established for the electronic equipment, and the acceleration factor of the electronic equipment was comprehensively calculated. The gray relational entropy analysis and distance coefficient analysis methods were adopted to analyze and evaluate the correlation between natural storage and accelerated storage data, thus verifying the accelerability. Finally, by comparing the extrapolated life results of natural and accelerated storage life test data, the accuracy of accelerated storage life test results for the electronic equipment was verified. By integrating the data from the natural storage test and the accelerated storage life test of a certain microwave electronic equipment, the error of the accelerated storage life test results relative to the natural storage test was less than 5%, and the acceleration factor and life evaluation results were accurate. This research offers an innovative technical approach for carrying out accelerated storage life tests and evaluations on the electronic equipment. |
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