| 李昊,周于博,赵朋飞,张翔羽,李群,张生鹏.机载TR组件散热性能退化建模与寿命预测方法[J].装备环境工程,2025,22(5):26-33. LI Hao,ZHOU Yubo,ZHAO Pengfei,ZHANG Xiangyu,LI Qun,ZHANG Shengpeng.Thermal Degradation Modelling and Lifetime Prediction Method of Airborne TR Module[J].Equipment Environmental Engineering,2025,22(5):26-33. |
| 机载TR组件散热性能退化建模与寿命预测方法 |
| Thermal Degradation Modelling and Lifetime Prediction Method of Airborne TR Module |
| 投稿时间：2025-02-23 修订日期：2025-03-30 |
| DOI：10.7643/issn.1672-9242.2025.05.005 |
| 中文关键词: TR组件 导热硅脂 散热性能 退化建模 加速试验 寿命预测中图分类号:V416 文献标志码:A 文章编号:1672-9242(2025)05-0026-08 |
| 英文关键词:TR module thermal grease thermal performance degradation model accelerated test life prediction |
| 基金项目:技术基础科研项目(JSH2022209A001) |
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| Author | Institution |
| LI Hao | Aerospace Science & Industry Corp Defense Technology R&T Center, Beijing 100854, China |
| ZHOU Yubo | School of Astronautics, Xi'an Jiaotong University, Xi'an 710049, China |
| ZHAO Pengfei | Aerospace Science & Industry Corp Defense Technology R&T Center, Beijing 100854, China |
| ZHANG Xiangyu | Aerospace Science & Industry Corp Defense Technology R&T Center, Beijing 100854, China |
| LI Qun | School of Astronautics, Xi'an Jiaotong University, Xi'an 710049, China |
| ZHANG Shengpeng | Aerospace Science & Industry Corp Defense Technology R&T Center, Beijing 100854, China |
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| 中文摘要: |
| 目的 揭示机载TR组件长期贮存使用条件下的散热性能退化机理，预测组件的散热性能退化寿命。方法 分析确定TR组件散热性能退化的主要机理为外力作用导致硅脂挤出渗出，以及硅脂中硅油挥发。采用等效导热系数为表征参数，构建TR组件散热性能表征模型，并从退化机理出发，采用修正的Lucas- Washburn(LW)方程刻画硅脂挤出渗出现象，采用经典挥发模型刻画硅油挥发现象，构建TR组件层间硅脂硅油质量损失模型及等效导热系数退化模型。设计开展损伤加速试验，利用试件质量损失数据对所构架的质量损失模型进行校验，并基于验证后的模型预测TR组件散热性能退化失效寿命。结果 基于前3个循环的损伤加速试验数据拟合得到的模型，对第4个循环的试件质量损失的预测结果与实测值相对误差仅1.53%，证明了所提模型的有效性。再使用所有循环的试验数据重新拟合TR组件层间硅脂等效导热系数退化模型，并预测TR组件散热性能退化失效寿命。计算结果表明，在贮存使用9.03 a后，所讨论的TR组件会因散热性能不满足工作要求而失效。结论 本文所提模型具有较强物理含义，且实验验证结果表明，模型预测误差小，精度高，说明所提模型能够较好刻画TR组件散热性能退化过程。同时，模型参数较少，可通过少量试验完成参数确定，因此具备较强指导与应用价值。 |
| 英文摘要: |
| The work aims to reveal the degradation mechanism of thermal performance in airborne TR modules under long-term storage conditions and predict their thermal degradation lifespan. The two main degradation mechanisms of TR modules were identified as thermal grease extrusion caused by external forces and silicone oil volatilization. A thermal performance characterization model was established with equivalent thermal conductivity as the key parameter. By integrating a modified Lucas-Washburn (LW) equation to describe grease extrusion phenomena and classical volatilization models to simulate oil evaporation, a comprehensive mass loss model and an equivalent thermal conductivity degradation model were developed. Accelerated degradation tests were designed and conducted to validate the mass loss model with samples weight loss data, followed by the thermal degradation lifespan prediction of TR modules based on verified models. The model calibrated with first three test cycles demonstrated the effectiveness of the proposed models, showing only 1.53% relative error between prediction results and measured results of the fourth-cycle weight loss. Then, the degradation model of equivalent thermal conductivity of silicone grease between layers of TR modules was re-fitted by the test data of all cycles, and the thermal degradation lifespan of TR modules was predicted. The calculation results showed that after 9.03 years of storage, the TR modules in question would fail because the thermal performance could not meet the working requirements. The model proposed has strong physical meaning, and the experimental results show that the prediction error of the model is small and the precision is high, which indicates that the proposed model can describe the thermal degradation process of TR modules well. At the same time, the model has few parameters, which can be determined through a few experiments, so it has strong guidance and application value. |
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