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| Reliability Assessment of Electronic Parts Based on Cumulative Degradation by SSADT |
| Received:June 07, 2013 Revised:September 01, 2013 |
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| DOI：10.7643/issn.1672-9242.2013.05.029 |
| KeyWord:ammunition electronic parts cumulative degradation amount accelerated degradation testing（ADT） step-stress constant-stress reliability assessment |
| Author | Institution |
| FAN Zhi-feng |
Department of Ammunition Engineering，Ordnance Engineering College，Shijiazhuang05003，China |
| QI Xing-lin |
Department of Ammunition Engineering，Ordnance Engineering College，Shijiazhuang05003，China |
| CUI Ping |
Department of Ammunition Engineering，Ordnance Engineering College，Shijiazhuang05003，China |
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| Abstract: |
| In order to assess the storage reliability of electronic parts of new ammunition quickly, the method of step-stress accelerated degradation testing (SSADT) was put forward. First the scheme of electronic parts by SSADT was expatiated. Then the basic hypothesis of reliability assessment of electronic parts based on cumulative degradation by SSADT was brought forward. The train of thought and method of the reliability assessment method was analyzed particularly. The method achieved storage reliability assessment of ammunition electronic parts under the condition of "zero failure". |
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