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| An Evaluation Method of Accelerated Storage Life Test for Mechanical and Electronic Products |
| Received:April 13, 2015 Revised:August 15, 2015 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/issn.1672-9242.2015.04.021 |
| KeyWord:accelerated storage life test storage life evaluation pseudo life acceleration equation |
| Author | Institution |
| YANG Ce |
Naval Academy of Armament， Beijing ， China |
| LI Hong-zhi |
Beihang University， Beijing ， China |
| YAO Jin-yong |
Beihang University， Beijing ， China |
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| Abstract: |
| Objective To study the method to evaluate storage life for long-term storage products. Methods With the preprocessed data from the step stress accelerated storage life test, performance degradation path was built to obtain the pseudo life. After estimating parameters of the life distribution at high stress levels, storage life distribution in normal stress level was extrapolated by the acceleration equation. Results Storage life under normal storage condition was deduced. Conclusion The method proposed in this paper could avoid complicated performance degradation modeling and effectively evaluate the storage life of products with small sample volume and little failure information. |
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