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| The Storage Life Assessment of Electronic Components in a Missile |
| Received:May 24, 2016 Revised:November 01, 2016 |
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| DOI：10.7643/ issn.1672-9242.2016.06.020 |
| KeyWord:Electronic Components Step-up-stress Newton-Raphson method Lifetime Assessment |
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| Abstract: |
| Objective To study estimating the storage life of electronic components in a Missile under a certain degree of reliability based on censoring data from step-up-stress accelerated life test.Methods First, the testing time under the stress of Si (i>1) was converted to the equivalent time under the stress S1. Then, a step-up-stress accelerated life test model based on Two-parameter Weibull distribution was established and the unknown parameter was solved by Newton-Raphson method. At last, The storage life under normal stress was estimated by Arrhenius equation.Results when the reliability was 0.9999 at 25 degrees Celsius, the storage life of electronic components based on censoring data from step-up-stress accelerated test was about 11.89 years, and the life based on constant-stress accelerated test was about 13.32 years, the evaluation results of the two test methods were not quite different.Conclusion step-up-stress accelerated life test time was short, the sample was small and the cost was low, has certain superiority compared with constant-stress accelerated test. |
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