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| Verification Method of Accelerated Storage Test Results for Electronic Equipment |
| Received:March 28, 2025 Revised:May 04, 2025 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/issn.1672-9242.2025.05.006 |
| KeyWord:electronic equipment accelerated storage life test correlation analysis gray relational entropy distance coefficient life evaluation |
| Author | Institution |
| TANG Yubin |
Aerospace Science and Industry Defense Technology Research and Test Center, Beijing , China |
| ZHANG Shengpeng |
Aerospace Science and Industry Defense Technology Research and Test Center, Beijing , China |
| XU Ruyuan |
Aerospace Science and Industry Defense Technology Research and Test Center, Beijing , China |
| LI Hao |
Aerospace Science and Industry Defense Technology Research and Test Center, Beijing , China |
| NI Ruizheng |
Aerospace Science and Industry Defense Technology Research and Test Center, Beijing , China |
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| Abstract: |
| The work aims to determine the acceleration factor of the electronic equipment and evaluate the accuracy of the accelerated storage life test results. Based on the storage life information of component products, a storage life model was established for the electronic equipment, and the acceleration factor of the electronic equipment was comprehensively calculated. The gray relational entropy analysis and distance coefficient analysis methods were adopted to analyze and evaluate the correlation between natural storage and accelerated storage data, thus verifying the accelerability. Finally, by comparing the extrapolated life results of natural and accelerated storage life test data, the accuracy of accelerated storage life test results for the electronic equipment was verified. By integrating the data from the natural storage test and the accelerated storage life test of a certain microwave electronic equipment, the error of the accelerated storage life test results relative to the natural storage test was less than 5%, and the acceleration factor and life evaluation results were accurate. This research offers an innovative technical approach for carrying out accelerated storage life tests and evaluations on the electronic equipment. |
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