Methods and Application of Accelerated Testing Schemes for the Operational Life of Complete Electronic Instruments

XUE Liangliang; HU Yuqing; SONG Yue

doi:10.7643/issn.1672-9242.2026.06.007

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Equipment Environmental Engineering ›› 2026, Vol. 23 ›› Issue (6) : 80-91. DOI: 10.7643/issn.1672-9242.2026.06.007

Aviation and Aerospace Equipment

Methods and Application of Accelerated Testing Schemes for the Operational Life of Complete Electronic Instruments

XUE Liangliang, HU Yuqing, SONG Yue

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Abstract

To address the challenges of high operational life targets, small sample sizes, and lengthy testing periods during the performance qualification phase of electronic instrument products, the work aims to propose an accelerated life testing scheme combining underlying product information, system reliability model and Flotherm simulation for the complete instrument. Through the analysis of operational environment sensitive stresses, weak links of the complete instrument and failure mechanisms, the key functional circuits of the complete instrument were identified. By integrating a system reliability series-parallel model with component-level activation energy information, and considering the temperature rise effect caused by prolonged power-on, the Arrhenius model was modified with the temperature simulation data. The acceleration factor for the complete instrument under temperature sensitive stress was derived theoretically. With a certain type of power distributor under long-term power-on as an example, the calculation process was obtained, resulting in an accelerated testing profile for the complete instrument. Finally, based on temperature sensitive stress acceleration, and in consideration of humidity, electric field environmental stresses, and their failure mechanisms, design methodologies for accelerated testing under combined temperature-humidity and temperature-electric field dual stresses were synchronously proposed. This work provides a reference for a general accelerated testing scheme for complete on-board instrument products with small sample sizes under long-term power-on conditions.

Key words

electronic instruments / small sample size / operational life / accelerated testing / system reliability model / Flotherm simulation

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XUE Liangliang, HU Yuqing, SONG Yue. Methods and Application of Accelerated Testing Schemes for the Operational Life of Complete Electronic Instruments[J]. Equipment Environmental Engineering. 2026, 23(6): 80-91 https://doi.org/10.7643/issn.1672-9242.2026.06.007

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